EN 60749-38:2008現(xiàn)行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 38: Soft Error Test Method For Semiconductor Devices With Memory
出版：European Committee for Standards - Electrical
專家解讀視頻
2008 [01/05/2008]
IEC 60749-38 Ed. 1.0 - Identical
BS EN 60749-38:2008 - Identical
NF EN 60749-38:2008 - Identical
NEN EN IEC 60749-38:2008 - Identical
DIN EN 60749-38 (2008-10) - Identical
OVE/ONORM EN 60749-38:2008 - Identical
PN EN 60749-38:2008 - Identical
SS EN 60749-38 Ed. 1 (2009) - Identical
NBN EN 60749-38:2008 - Identical
I.S. EN 60749-38:2008 - Identical
CEI EN 60749-38 Ed. 1 (2010) - Identical
DS EN 60749-38:2008 - Identical
