NF EN 60749-38:2008現行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 38: Soft Error Test Method For Semiconductor Devices With Memory
出版：Association Francaise de Normalisation
專家解讀視頻
2008 [01/06/2008]2006 PR [01/12/2006]
Indice de classement: C96-022-38. PR NF EN 60749-38 December 2006. (12/2006)
IEC 60749-38 Ed. 1.0 - Identical
EN 60749-38:2008 - Identical
IEC 60749-38 : 1.0 - Identical
EN 60749-38 : 2008 - Identical
IEC 60749-38 : 1.0 - Identical
