国产精品久久久在线观看_亚洲免费观看视频网站_国产盗摄视频一区二区三区_久久久国产一级 - 日本在线观看一区

歡迎來到寰標網！ 客服QQ：772084082 加入會員
已選條件： 半導體器件綜合
每頁顯示20 條，共找到 1734 條結果 <1/87>
標準編號 標準名稱 發布部門 發布日期 狀態
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General Internatio.. 2020-03-08 現行
IEC 60747-1:2006/AMD1:2010 Amendment 1 - Semiconductor devices - Part 1: General Internatio.. 2020-03-08 現行
IEC 60747-1:2006/COR1:2008 Corrigendum 1 - Semiconductor devices - Part 1: General Internatio.. 2020-03-08 現行
IEC 60747-1:2006 Semiconductor devices - Part 1: General Internatio.. 2020-03-08 現行
I.S. EN IEC 60749-26:2018 Semiconductor Devices - Mechanical and Climatic Test Methods Part 26: Electrostatic Discharge (esd) Sensitivity Testing Human Body Model (hbm) National S.. 2018-04-10 現行
I.S. EN IEC 60749-12:2018 Semiconductor Devices - Mechanical and Climatic Test Methods Part 12: Vibration, Variable Frequency National S.. 2018-03-27 現行
IEC 60191-4 Ed. 3.1 Mechanical standardization of semiconductor devices Part 4: Coding system and classification into forms of package outlines for semiconductor device packages Internatio.. 2018-03-27 現行
IEC 60191-4 Amd.1 Ed. 3.0 Amendment 1 - Mechanical standardization of semiconductor devices Part 4: Coding system and classification into forms of package outlines for semiconductor device packages Internatio.. 2018-03-27 現行
ASTM F1190-18 Standard Guide for Neutron Irradiation of Unbiased Electronic Components American S.. 2018-03-01 現行
ASTM F1192-11(2018) Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices American S.. 2018-03-01 現行
ASTM F1893-18 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices American S.. 2018-03-01 現行
IEC 60749-13 Ed. 2.0 Semiconductor devices - Mechanical and climatic test methods Part 13: Salt atmosphere Internatio.. 2018-02-15 現行
IEC 60191-1 Ed. 3.0 Mechanical standardization of semiconductor devices Part 1: General rules for the preparation of outline drawings of discrete devices Internatio.. 2018-01-23 現行
IEC 60749-26 Ed. 4.0 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) Internatio.. 2018-01-15 現行
IEC 60749-12 Ed. 2.0 Semiconductor devices - Mechanical and climatic test methods Part 12: Vibration, variable frequency Internatio.. 2017-12-13 現行
IEC/TR 63133 Ed. 1.0 Semiconductor devices - Scan based ageing level estimation for semiconductor devices Internatio.. 2017-10-11 現行
I.S. EN 60749-43:2017 Semiconductor Devices - Mechanical and Climatic Test Methods Part 43: Guidelines for ic Reliability Qualification Plans National S.. 2017-09-19 現行
IEC 60050-521-Amd.1 Ed. 2.0 Amendment 1 - International Electrotechnical Vocabulary Part 521: Semiconductor devices and integrated circuits Internatio.. 2017-08-30 現行
IEC 62880-1 Ed. 1.0 Semiconductor devices - Stress migration test standard Part 1: Copper stress migration test standard Internatio.. 2017-08-23 現行
I.S. EN 60749-5:2017 Semiconductor Devices - Mechanical and Climatic Test Methods Part 5: Steady-state Temperature Humidity Bias Life Test (iec 60749-5:2017) National S.. 2017-07-25 現行
cacheName: