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IEC 60749-27 Ed. 2.0現(xiàn)行

Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

出版：International Electrotechnical Committee

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基本信息

標準編號： IEC 60749-27 Ed. 2.0

發(fā)布時間：2006/7/18 0:00:00

標準類別：Standard

出版單位：International Electrotechnical Committee

標準頁數(shù)：25

標準簡介

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive

本標準替代的舊標準

IEC/PAS 62180 Ed. 1.0

IEC 60749-27 Ed. 1.0

替代本標準的新標準

IEC 60749-27 Ed. 2.1

等同采用的國際標準

PN EN 60749-27:2008 - Identical

NEN EN IEC 60749-27:2007 - Identical

CEI EN 60749-27 Ed. 1 (2007) - Identical

BS EN 60749-27:2006+A1:2012 - Identical

DIN EN 60749-27 (2007-01) - Identical

NF EN 60749-27:2006 - Identical