NEN EN IEC 60749-27:2007現行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 27: Electrostatic Discharge (esd) Sensitivity Testing - Machine Model (mm)
出版：Nederlands Normalisatie Instituut
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基本信息
標準編號： NEN EN IEC 60749-27:2007
發(fā)布時間：2007/11/1 0:00:00
標準類別：Standard
出版單位：Nederlands Normalisatie Instituut
標準頁數：25
標準簡介
Defines a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD).
