IEC 60749-27 Ed. 1.0被替代
Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
出版：International Electrotechnical Committee
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基本信息
標準編號： IEC 60749-27 Ed. 1.0
發布時間：2003/10/21 0:00:00
標準類別：Standard
出版單位：International Electrotechnical Committee
標準頁數：25
標準簡介
Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed. The testing shall be selected from this test method or the human body model (see IEC 60749-26).
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