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標準編號 標準名稱 發(fā)布部門 發(fā)布日期 狀態(tài)
I.S. EN 60749-44:2016 Semiconductor Devices - Mechanical and Climatic Test Methods Part 44: Neutron Beam Irradiated Single Event Effect (see) Test Method for Semiconductor Devices National S.. 2016-11-08 現(xiàn)行
IEC 60191-6-13 Ed. 2.0 Mechanical standardization of semiconductor devices Part 6-13: Design guideline of open-top-type sockets for Fine-pitch Ball Grid Array (FBGA) and Fine-pitch Land Grid Array (FLGA) Internatio.. 2016-09-27 現(xiàn)行
IEC 61975 Ed. 1.1 High-voltage direct current (HVDC) installations - System tests Internatio.. 2016-09-12 現(xiàn)行
IEC 61975 Amd.1 Ed. 1.0 Amendment 1 - High-voltage direct current (HVDC) installations - System tests Internatio.. 2016-09-12 現(xiàn)行
DIN EN 62969-2 (2016-09) Semiconductor Devices - Semiconductor Interface For Automotive Vehicles - Part 2: Efficiency Evaluation Methods Of Wireless Power Transmission Using Resonance For Automotive Vehicles Sensors (iec 47/2273/cd:2016) Verband De.. 2016-09-01 現(xiàn)行
DIN EN 62969-4 (2016-08) Semiconductor Devices - Semiconductor Interface For Automotive Vehicles - Part 4: Evaluation Method Of Data Interface For Automotive Vehicle Sensors (iec 47/2275/cd:2016) Verband De.. 2016-08-01 現(xiàn)行
DIN EN 62047-29 (2016-08) Semiconductor devices - Micro-electromechanical devices Part 29: Electromechanical relaxation test method for freestanding conductive thin-films under room temperature (IEC 47F/243/CD:2016) German Ins.. 2016-08-01 現(xiàn)行
IEC 60749-44 Ed. 1.0 Semiconductor devices - Mechanical and climatic test methods Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices Internatio.. 2016-07-21 現(xiàn)行
I.S. EN 62779-3:2016 Semiconductor Devices - Semiconductor Interface for Human Body Communication Part 3: Functional Type and its Operational Conditions National S.. 2016-06-28 現(xiàn)行
I.S. EN 62779-1:2016 Semiconductor Devices - Semiconductor Interface for Human Body Communication Part 1: General Requirements National S.. 2016-06-21 現(xiàn)行
I.S. EN 62779-2:2016 Semiconductor Devices - Semiconductor Interface for Human Body Communication Part 2: Characterization of Interfacing Performances National S.. 2016-06-14 現(xiàn)行
ASTM E431-96(2016) Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices American S.. 2016-06-01 現(xiàn)行
IEC 62779-3 Ed. 1.0 Semiconductor devices - Semiconductor interface for human body communication Part 3: Functional type and its operational conditions Internatio.. 2016-04-26 現(xiàn)行
IEC 62779-2 Ed. 1.0 Semiconductor devices - Semiconductor interface for human body communication Part 2: Characterization of interfacing performances Internatio.. 2016-02-18 現(xiàn)行
IEC 62779-1 Ed. 1.0 Semiconductor devices - Semiconductor interface for human body communication Part 1: General requirements Internatio.. 2016-02-18 現(xiàn)行
DIN EN 62047-15 (2016-01) Semiconductor Devices - Micro-electromechanical Devices - Part 15: Test Method Of Bonding Strength Between Pdms And Glass (iec 62047-15:2015) German Ins.. 2016-01-01 現(xiàn)行
DIN EN 62047-16 (2015-12) Semiconductor Devices - Micro-electromechanical Devices - Part 16: Test Methods For Determining Residual Stresses Of Mems Films - Wafer Curvature And Cantilever Beam Deflection Methods (iec 62047-16:2015) German Ins.. 2015-12-01 現(xiàn)行
DIN EN 62047-17 (2015-12) Semiconductor Devices - Micro-electromechanical Devices - Part 17: Bulge Test Method For Measuring Mechanical Properties Of Thin Films (iec 62047-17:2015) German Ins.. 2015-12-01 現(xiàn)行
I.S. EN 62007-1:2015 Semiconductor Optoelectronic Devices for Fibre Optic System Applications Part 1: Specification Template for Essential Ratings and Characteristics National S.. 2015-07-14 現(xiàn)行
BS EN 60747-5-5:2011+A1:2015 Semiconductor Devices - Discrete Devices - Part 5-5: Optoelectronic Devices - Photocouplers British St.. 2015-06-30 現(xiàn)行
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