I.S. EN 60749-44:2016現行
Semiconductor Devices - Mechanical and Climatic Test Methods Part 44: Neutron Beam Irradiated Single Event Effect (see) Test Method for Semiconductor Devices
出版：National Standards Authority of Ireland
專家解讀視頻
基本信息
標準編號： I.S. EN 60749-44:2016
發布時間：2016/11/8 0:00:00
標準類別：Standard
出版單位：National Standards Authority of Ireland
標準頁數：54
標準簡介
Defines a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays.
