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每頁顯示20 條，共找到 1260 條結果 <3/63>
標準編號 標準名稱 發布部門 發布日期 狀態
NF EN 62215-3:2014 Integrated Circuits - Measurement Of Impulse Immunity - Part 3: Non-Synchronous Transient Injection Method Associatio.. 2014-03-01 現行
DS EN 62215-3:2013 Integrated Circuits - Measurement Of Impulse Immunity - Part 3: Non-Synchronous Transient Injection Method Danish Sta.. 2013-12-19 現行
BS EN 62215-3:2013 Integrated Circuits - Measurement Of Impulse Immunity - Part 3: Non-Synchronous Transient Injection Method British St.. 2013-10-31 現行
I.S. EN 62215-3:2013 Integrated Circuits - Measurement of Impulse Immunity Part 3: Non-synchronous Transient Injection Method (iec 62215-3:2013 (eqv)) National S.. 2013-10-08 現行
DIN EN 62435-5 (2013-10) Electronic components - Long-term storage of electronic semiconductor devices Part 5: Die & Wafer Devices (IEC 47/2174/CD:2013) German Ins.. 2013-10-01 廢止
DIN EN 62435-2 (2013-10) Electronic components - Long-term storage of electronic semiconductor devices Part 2: Deterioration Mechanisms (IEC 47/2173/CD:2013) German Ins.. 2013-10-01 廢止
DIN EN 62435-1 (2013-10) Electronic components - Long-term storage of electronic semiconductor devices Part 1: General (IEC 47/2172/CD:2013) German Ins.. 2013-10-01 廢止
NEN EN IEC 62215-3:2013 Integrated Circuits - Measurement Of Impulse Immunity - Part 3: Non-Synchronous Transient Injection Method Nederlands.. 2013-10-01 現行
NF EN 62433-2:2013 Emc Ic Modelling - Part 2: Models Of Integrated Circuits For Emi Behavioural Simulation - Conducted Emissions Modelling (Icem-Ce) Associatio.. 2013-09-01 被替代
GOST R 54844:2011 Integrated Microcircuits - Basic Dimensions Interstand.. 2013-09-01 現行
GOST R 54843:2011 Microsystem Technology Products - Sensitive Elements Of Microelectromechanical Transducers Of Physical Quantities - Generic Specifications Interstand.. 2013-09-01 現行
NF EN 165000-5:2013 Associatio.. 2013-08-01 被替代
IEC 62215-3 Ed. 1.0 Integrated circuits - Measurement of impulse immunity Part 3: Non-synchronous transient injection method Internatio.. 2013-07-17 現行
EIA JESD 22-A100:2013 Cycled Temperature-Humidity-Bias Life Test Joint Elec.. 2013-07-01 現行
CEI EN 62132-8 Ed. 1 (2013) Integrated Circuits - Measurement Of Electromagnetic Immunity - Part 8: Measurement Of Radiated Immunity - Ic Stripline Method Comitato E.. 2013-06-01 現行
IEEE 1149.1:2013 Test Access Port And Boundary-Scan Architecture Institute .. 2013-05-13 現行
NF EN 190107:2013 Family Specification: Ttl Fast Digital Integrated Circuits - Series 54F, 74F Associatio.. 2013-04-01 現行
NF EN 190109:2013 Associatio.. 2013-04-01 現行
NF EN 190000:2013 Harmonized System Of Quality Assessment For Electronic Components - Generic Specification: Monolithic Integrated Circuits Associatio.. 2013-04-01 現行
NF EN 190101:2013 Family Specification: Digital Integrated Ttl Circuits - Series 54, 64, 74, 84 Associatio.. 2013-04-01 現行
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