IEEE 1149.1:2013現行
Test Access Port And Boundary-Scan Architecture
出版：Institute of Electrical and Electronics Engineers
專家解讀視頻
基本信息
標準編號： IEEE 1149.1:2013
發布時間：2013/5/13 0:00:00
標準類別：Standard
出版單位：Institute of Electrical and Electronics Engineers
標準頁數：444
標準簡介
Covers a general overview of the operation of a component compatible with this standard and provides a background to the detailed discussion in later clauses.
標準備注
Supersedes IEEE 1149.1B. (09/2001) Supersedes IEEE DRAFT 1149.1. (02/2005)
