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Integrated Circuits - Measurement of Impulse Immunity Part 3: Non-synchronous Transient Injection Method (iec 62215-3:2013 (eqv))
出版:National Standards Authority of Ireland

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基本信息
標(biāo)準(zhǔn)編號: I.S. EN 62215-3:2013
發(fā)布時間:2013/10/8 0:00:00
標(biāo)準(zhǔn)類別:Standard
出版單位:National Standards Authority of Ireland
標(biāo)準(zhǔn)頁數(shù):38
標(biāo)準(zhǔn)簡介
Defines a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances.
等同采用的國際標(biāo)準(zhǔn)
EN 62215-3 : 2013 - Identical