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每頁顯示20 條，共找到 367 條結果 <2/19>
標準編號 標準名稱 發布部門 發布日期 狀態
KS D ISO TR 14321:2011 Sintered metal materials, excluding hardmetals-Metallographic preparation and examination Korean Sta.. 2011-09-30 被替代
NF EN 62047-4:2011 Semiconductor Devices - Micro-Electromechanical Devices - Part 4: Generic Specifications For Mems Associatio.. 2011-09-01 現行
ASTM F1894-98(2011) Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness American S.. 2011-06-01 現行
ASTM F2113-01(2011) Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications American S.. 2011-06-01 現行
OVE/ONORM EN 60146-1-1:2011 Semiconductor Converters - General Requirements And Line Commutated Converters - Part 1-1: Specification Of Basic Requirements Osterreich.. 2011-05-01 現行
KS D 0267:2011 Estimation of Boron Content in Silicon Korean Sta.. 2011-03-25 現行
PD IEC TR 60146-1-2:2011 Semiconductor converters. General requirements and line commutated converters. Application guide British St.. 2011-02-28 現行
NEN NPR IEC/TR 60146-1-2:2011 Semiconductor Converters - General Requirements And Line Commutated Converters - Part 1-2: Application Guide Nederlands.. 2011-02-01 現行
IEC/TR 60146-1-2 Ed. 4.0 Semiconductor converters - General requirements and line commutated converters Part 1-2: Application guide Internatio.. 2011-01-26 現行
ASTM F980-10e1 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices American S.. 2010-12-01 被替代
SS EN 60146-1-1 Ed. 2 (2010) Semiconductor Convertors - General Requirements And Line Commutated Convertors - Part 1-1: Specifications Of Basic Requirements Standardis.. 2010-11-22 現行
PN EN 60146-1-1:2010 Semiconductor Convertors - General Requirements And Line Commutated Convertors - Part 1-1: Specifications Of Basic Requirements Polish Com.. 2010-11-03 現行
NF EN 62047-6:2010 Semiconductor Devices - Micro-Electromechanical Devices - Part 6: Axial Fatigue Testing Methods Of Thin Film Materials Associatio.. 2010-09-01 現行
BS EN 60146-1-1:2010 Semiconductor converters. General requirements and line commutated converters. Specification of basic requirements British St.. 2010-08-31 現行
NEN EN IEC 60146-1-1:2010 Semiconductor Converters - General Requirements And Line Commutated Converters - Part 1-1: Specification Of Basic Requirements Nederlands.. 2010-08-01 現行
I.S. EN 60146-1-1:2010 Semiconductor Converters - General Requirements and Line Commutated Converters Part 1-1: Specification of Basic Requirements National S.. 2010-07-19 現行
DIN 50451-5 (2010-03) Testing Of Materials For Semiconductor Technology - Determination Of Trace Elements In Liquids - Part 5: Guideline For The Selection Of Materials And Testing Of Their Suitability For Apparatus For Sampling And Sample Preparation For The Determination Of Trace Elements In The Range Of Micrograms Per Kilogram And Nanograms Per Kilogram German Ins.. 2010-03-01 現行
NF EN 62047-9:2010 Semiconductor Devices - Micro-electromechanical Devices - Part 9: Wafer To Wafer Bonding Strength Measurement For Mems Associatio.. 2010-01-01 被替代
KS D ISO 9717:2009 Phosphate conversion coatings for metals-Method of specifying requirements Korean Sta.. 2009-12-30 被替代
DIN 50455-1 (2009-10) Testing Of Materials For Semiconductor Technology - Methods For Characterizing Photoresists - Part 1: Determination Of Coating Thickness With Optical Methods German Ins.. 2009-10-01 現行
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