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每頁顯示20 條，共找到 367 條結果 <1/19>
標準編號 標準名稱 發布部門 發布日期 狀態
DIN 50451-7 (2017-02) Testing Of Materials For Semiconductor Technology - Determination Of Traces Of Elements In Liquids - Part 7: Determination Of 31 Elements In High-purity Hydrochloric Acid By Icp-ms German Ins.. 2017-02-01 現行
DIN SPEC 1994 (2017-02) Testing Of Materials For Semiconductor Technology - Determination Of Anions In Weak Acids German Ins.. 2017-02-01 現行
ASTM F980-16 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices American S.. 2016-12-01 現行
DIN SPEC 1994 (2016-07) Testing Of Materials For Semiconductor Technology - Determination Of Anions In Weak Acids German Ins.. 2016-07-01 被替代
ASTM F76-08(2016)e1 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors American S.. 2016-05-01 現行
ASTM F76-08(2016) Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors American S.. 2016-05-01 被替代
NF EN 62047-22:2014 Semiconductor Devices - Micro-Electromechanical Devices - Part 22: Electromechanical Tensile Test Method For Conductive Thin Films On Flexible Substrates Associatio.. 2014-12-01 現行
DIN 50451-3 (2014-11) Testing Of Materials For Semiconductor Technology - Determination Of Traces Of Elements In Liquids - Part 3: Determination Of 31 Elements In High-purity Nitric Acid By Icp-ms German Ins.. 2014-11-01 現行
DIN 50451-6 (2014-11) Testing Of Materials For Semiconductor Technology - Determination Of Traces Of Elements In Liquids - Part 6: Determination Of 36 Elements In A High-purity Ammonium Fluoride Solution (nh[4]f) And In Etching Mixtures Of High-purity Ammonium Fluoride Solution Containing Hydrofluoric Acid German Ins.. 2014-11-01 現行
NF EN 62047-11:2014 Semiconductor Devices - Micro-Electromechanical Devices - Part 11: Test Method For Coefficients Of Linear Thermal Expansion Of Free-Standing Materials For Micro-Electromechanical Systems Associatio.. 2014-03-01 現行
CEI EN 60146-1-1 Ed. 2 (2013) Semiconductor Converters - General Requirements And Line Commutated Converters - Part 1-1: Specification Of Basic Requirements Comitato E.. 2013-11-01 現行
KS L 1619:2013 Testing methods for resistivity of conductive fine ceramic thin films with four point probe array Korean Sta.. 2013-10-26 現行
NF EN 62047-22:2013 Associatio.. 2013-06-01 被替代
ASTM F615M-95(2013) Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric) American S.. 2013-05-01 現行
SANS 6284-2 Ed. 2.01 (2012) Test Methods For Cross-Linked Polyethylene (Xlpe) Insulated Electric Cables - Part 2: Tests On Extruded Semi-Conducting Screens South Afri.. 2012-12-19 現行
ASTM D6095-12 Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials American S.. 2012-11-01 現行
DIN 50451-6 (2012-11) Testing Of Materials For Semiconductor Technology - Determination Of Traces Of Elements In Liquids - Part 6: Determination Of 36 Elements In A High-purity Ammonium Fluoride Solution (nh[4]f) And In Etching Mixtures Of High-purity Ammonium Fluoride Solution Containing Hydrofluoric Acid German Ins.. 2012-11-01 被替代
NF EN 62047-11:2012 Associatio.. 2012-05-01 被替代
NF EN 62047-9:2012 Semiconductor Devices - Micro-Electromechanical Devices - Part 9: Wafer To Wafer Bonding Strength Measurement For Mems Associatio.. 2012-04-01 現行
ASTM E1438-11 Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS American S.. 2011-11-01 現行
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