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每頁顯示20 條，共找到 367 條結果 <6/19>
標準編號 標準名稱 發布部門 發布日期 狀態
IEC 60146-1-1 Ed. 4.0 Semiconductor converters - General requirements and line commutated converters Part 1-1: Specification of basic requirements Internatio.. 2009-06-29 現行
NF EN 62047-6:2009 Semiconductor Devices - Micro-electromechanical Devices - Part 6: Axial Fatigue Testing Methods Of Thin Film Materials Associatio.. 2009-03-01 被替代
DIN 50451-5 (2008-09) Testing Of Materials For Semiconductor Technology - Determination Of Trace Elements In Liquids - Part 5: Guideline For The Selection Of Materials And Testing Of Their Suitability For Apparatus For Sampling And Sample Preparation For The Determination Of Trace Elements In The Range Of Micrograms Per Kilogram And Nanograms Per Kilogram German Ins.. 2008-09-01 被替代
KS D 0078:2008 Test method for determination of impurity concentrations in silicon crystal by photoluminescence spectroscopy Korean Sta.. 2008-06-30 現行
ASTM F76-08 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors American S.. 2008-06-15 被替代
ASTM D3004-08 Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials American S.. 2008-05-01 被替代
ASTM F1404-92(2007) Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique American S.. 2007-12-01 廢止
SANS 6284-2 Ed. 2 (2007) Test Methods For Cross-linked Polyethylene (xlpe) Insulated Electric Cables - Part 2: Tests On Extruded Semi-conducting Screens South Afri.. 2007-08-03 被替代
NF EN 62047-4:2007 Semiconductor Devices - Micro-electromechanical Devices - Part 4: Generic Specifications For Mems Associatio.. 2007-07-01 被替代
KS D ISO TR 12662:2006 Certification scheme for prestressing steels Korean Sta.. 2006-12-18 被替代
ASTM E1438-06 Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS American S.. 2006-11-01 被替代
NF EN 62047-2:2006 Semiconductor Devices - Micro-electromechanical Devices - Part 2: Tensile Testing Methods Of Thin Film Materials Associatio.. 2006-11-01 現行
NF EN 62047-3:2006 Semiconductor Devices - Micro-electromechanical Devices - Part 3: Thin Film Standard Test Piece For Tensile Testing Associatio.. 2006-11-01 現行
ASTM D6095-06 Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials American S.. 2006-04-01 被替代
KS D ISO TR 11637:2005 Boron treated engineering steels for quenching and tempering Korean Sta.. 2005-12-27 被替代
ASTM D6095-05 Standard Test Method for Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials American S.. 2005-03-01 被替代
KS D ISO 90-2:2004 Light gauge metal containers -Definitions and determination of dimensions and capacities -Part 2 General use containers Korean Sta.. 2004-12-03 被替代
KS D ISO 90-3:2004 Light gauge metal containers-Definitions and determination of dimensions and capacities-Part 3:Aerosol cans Korean Sta.. 2004-12-03 被替代
ASTM E161-00(2004) Standard Specification for Precision Electroformed Sieves American S.. 2004-10-01 被替代
KS M 8527:2004 Potassium 1, 2-naphthoquinone-4-sulfonate Korean Sta.. 2004-09-04 被替代
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