IEC 61163-2 Ed. 1.0被替代
Reliability stress screening Part 2: Electronic components （IEC 61163-2:1998）
出版：International Electrotechnical Committee
專家解讀視頻
IEC 61163-2:1998 Provides guidance on reliability stress screening techniques and procedures for electronic components. Is intended for use of a) component manufacturers as a guideline, b) component users as a guideline to negotiate with component manufacturers on stress screening requirements or plan a stress screening process in house due to reliability requirements, c) subcontractors who provide stress screening as a service.
UNE 200004-2:2003 - Identical
CEI 56-36 Ed. 1 (2000) - Identical
BS IEC 61163-2:1998 - Identical
PN IEC 61163-2:2004 - Identical
NEN IEC 61163-2:1998 - Identical
BIS IS 15444-2:2005 (R2016) - Identical
