IEC 60749-38 : 1.0現行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 38: SOFT ERROR TEST METHOD FOR SEMICONDUCTOR DEVICES WITH MEMORY
出版：International Electrotechnical Committee
專家解讀視頻
Establishes a procedure for measuring the soft error susceptibility of semiconductor devices with memory when subjected to energetic particles such as alpha radiation.
DIN EN 60749-38 : 2008 - Identical
PN EN 60749-38 : 2008 - Identical
BS EN 60749-38 : 2008 - Identical
NEN EN IEC 60749-38 : 2008 - Identical
CEI EN 60749-38 : 2010 - Identical
I.S. EN 60749-38:2008 - Identical
DS EN 60749-38 : 2008 - Identical
NF EN 60749-38 : 2008 - Identical
