IEC 60749-32 : 1.1現行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)
出版：International Electrotechnical Committee
專家解讀視頻
Applies to semiconductor devices (discrete devices and integrated circuits).
I.S. EN 60749-32:2003 - Identical
DS EN 60749-32 : 2004 AMD 1 2010 - Identical
BS EN 60749-32 : 2003 - Identical
NEN EN IEC 60749-32 : 2003 AMD 1 2010 - Identical
DIN EN 60749-32 : 2011 - Identical
PN EN 60749-32 : 2005 AMD 1 2010 - Identical
SN EN 60749-32 : 2003 - Identical
