DS EN 60749-32 : 2004 AMD 1 2010現行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)
出版：Danish Standards
專家解讀視頻
基本信息
標準編號： DS EN 60749-32 : 2004 AMD 1 2010
標準類別：Standard
出版單位：Danish Standards
標準頁數：0
標準簡介
Pertains to semiconductor device (discrete devices and integrated circuits). The aim of this test is to determine whether the device ignites due to external heating.
等同采用的國際標準
IEC 60749-32 : 1.1 - Identical
EN 60749-32 : 2003 AMD 1 2010 - Identical
IEC 60749-32 : 1.1 - Identical
