IEC 60747-11 Ed. 1.0廢止
Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices
出版：International Electrotechnical Committee
專家解讀視頻
Applies to discrete semiconductor devices, excluding optoelectronic devices. Should be read together with the generic specification to which it refers: it gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor devices.
SS IEC 747 Ed. 2 (1993) - Identical
UTEC 96 011:1989 - Identical
PN 90/T-01204:1990 - Identical
DIN IEC 60747-11 (1992-04) - Identical
NEN 10747-11:1986 - Identical
BS QC 750100:1986+A2:1996 - Equivalent
BS QC 750000:1986 - Identical
