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BS QC 750100:1986+A2:1996現(xiàn)行

Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification

出版：British Standards Institution

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基本信息
標(biāo)準(zhǔn)編號(hào)： BS QC 750100:1986+A2:1996
發(fā)布時(shí)間：1986/12/31 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：British Standards Institution
標(biāo)準(zhǔn)頁(yè)數(shù)：22
標(biāo)準(zhǔn)簡(jiǎn)介

Procedures to be followed with discrete semiconductor devices (excluding optoelectronic devices), the possible group conditions for structurally similar devices, the requirements for quality conformance inspection and the various steps for screening. Also preferred values of voltages and currents, identification of terminals.

標(biāo)準(zhǔn)備注

? British Standards Institution 2013

Amendment notes:
AMD 7208 published 15 October 1992
Amendment, January 2010. Amends and replaces BS QC 750000:1986

Document identifier notes:
Formerly BS QC 750000:1986.

本標(biāo)準(zhǔn)替代的舊標(biāo)準(zhǔn)

94/201366 DC

93/202808 DC

等同采用的國(guó)際標(biāo)準(zhǔn)

IEC 60747-11 Ed. 1.0 - Identical