BIS IS/IEC 61558-2-6 : 1ED 2016未知
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES
出版：Bureau of Indian Standards
專家解讀視頻
Defines a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays.
CEI EN 60749-44 : 1ED 2017 - Identical
NEN EN IEC 60749-44 : 2016 - Identical
NF EN 60749-44 : 2016 - Identical
SN EN 60749-44 : 2016 - Identical
BS EN 60749-44 : 2016 - Identical
DS EN 60749-44 : 2016 - Identical
DIN EN 60749-44 : 2017 - Identical
PN EN 60749-44 : 2017 - Identical
