CEI EN 60749-44 : 1ED 2017現行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES
出版：Comitato Elettrotecnico Italiano
專家解讀視頻
基本信息
標準編號： CEI EN 60749-44 : 1ED 2017
標準類別：Standard
出版單位：Comitato Elettrotecnico Italiano
標準頁數：0
標準簡介
Sets up a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays.
