I.S. EN 60749-9:2002被替代
Semiconductor Devices - Mechanical And Climatic Test Methods Part 9: Permanence Of Marking
出版：National Standards Authority of Ireland
專家解讀視頻
Describes the test and verify that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.
EN 60749-9:2002 - Identical
UNE EN 60749-9:2003 - Identical
BS EN 60749-9:2002 - Identical
DIN EN 60749-9 (2003-04) - Identical
NBN EN 60749-9:2003 - Identical
NF EN 60749-9:2002 - Identical
IEC 60749-9 Ed. 1.0 - Identical
SS EN 60749-9 Ed. 1 (2003) - Identical
EN 60749-9:2017 - Identical
