I.S. EN 60749:1999被替代
Semiconductor Devices Mechanical and Climatic Test Methods
出版：National Standards Authority of Ireland
專家解讀視頻
Defines test methods to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Additional test methods may be required for non-cavity devices.
BS EN 60749:1999 - Identical
SN EN 60749:1999 - Identical
SS EN 60749:1999 - Identical
EN 60749:1999 - Identical
UNE EN 60749:2000 - Identical
IEC 60749 Ed. 2.2 - Identical
NBN EN 60749:1999 - Identical
NF EN 60749:1999 - Identical
DIN EN 60749 (2002-09) - Identical
