IEC 60749-26 Ed. 2.0被替代
Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
出版：International Electrotechnical Committee
專家解讀視頻
Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.
OVE/ONORM EN 60749-26:2007 - Identical
PN EN 60749-26:2008 - Identical
NEN EN IEC 60749-26:2007 - Identical
CEI EN 60749-26 Ed. 1 (2007) - Identical
BS EN 60749-26:2006 - Identical
DIN EN 60749-26 (2007-01) - Identical
I.S. EN 60749-26:2006 - Identical
NF EN 60749-26:2006 - Identical
PN EN 60749-26:2006 - Identical
SS EN 60749-26 Ed. 1 (2006) - Identical
