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IEC 60749-26 Ed. 1.0被替代

Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

出版：International Electrotechnical Committee

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基本信息
標(biāo)準(zhǔn)編號(hào)： IEC 60749-26 Ed. 1.0
發(fā)布時(shí)間：2003/10/21 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：International Electrotechnical Committee
標(biāo)準(zhǔn)頁(yè)數(shù)：27
標(biāo)準(zhǔn)簡(jiǎn)介

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed. The testing shall be selected from this test method or the machine model test method (see IEC 60749-27).

本標(biāo)準(zhǔn)替代的舊標(biāo)準(zhǔn)

IEC/PAS 62179 Ed. 1.0

替代本標(biāo)準(zhǔn)的新標(biāo)準(zhǔn)

IEC 60749-26 Ed. 2.0