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BS ISO 17470:2014現(xiàn)行
Microbeam Analysis - Electron Probe Microanalysis - Guidelines For Qualitative Point Analysis By Wavelength Dispersive X-Ray Spectrometry
出版：British Standards Institution
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基本信息
標(biāo)準(zhǔn)編號(hào)： BS ISO 17470:2014
發(fā)布時(shí)間：2014/1/31 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：British Standards Institution
標(biāo)準(zhǔn)頁(yè)數(shù)：22
標(biāo)準(zhǔn)簡(jiǎn)介
Provides guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume (on a (mu)m[3] scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
標(biāo)準(zhǔn)備注
Supersedes 03/303319 DC (10/2004)
