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EIA JESD 340:1967 (R2009)現(xiàn)行

Standard For The Measurement Of Cre

出版：JEDEC Solid State Technology Association

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基本信息
標(biāo)準(zhǔn)編號(hào)： EIA JESD 340:1967 (R2009)
發(fā)布時(shí)間：2009/3/1 0:00:00
標(biāo)準(zhǔn)類(lèi)別：Standard
出版單位：JEDEC Solid State Technology Association
標(biāo)準(zhǔn)頁(yè)數(shù)：18
標(biāo)準(zhǔn)簡(jiǎn)介

Provides an easily measured parameter which is one of the main characteristics in determining the stability of a transistor intended for small-signal operation. The measurement allows for rapid testing. Its correlation to ac stability will help establish the interchangeability of a device.

標(biāo)準(zhǔn)備注

Renamed from EIA 340. (07/2010)

本標(biāo)準(zhǔn)替代的舊標(biāo)準(zhǔn)

EIA 340:1967 (R1999)