EIA 340:1967 (R1999)被替代
Standard For The Measurement Of Cre
出版：JEDEC Solid State Technology Association
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基本信息
標準編號： EIA 340:1967 (R1999)
標準類別：Standard
出版單位：JEDEC Solid State Technology Association
標準頁數：12
標準簡介
Provides an easily measured parameter which is one of the main characteristics in determining the stability of a transistor intended for small-signal operation. The measurement allows for rapid testing. Its correlation to ac stability will help establish the interchangeability of a device.
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