I.S. EN 60749-9:2017現行
Semiconductor Devices - Mechanical and Climatic Test Methods Part 9: Permanence of Marking
出版：National Standards Authority of Ireland
專家解讀視頻
Defines the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board manufacturing process.
BS EN 60749-9:2017 - Identical
EN 60749-9:2017 - Identical
EN 60749-9 : 2017 - Identical
NBN EN 60749-9 : 2003 - Identical
BS EN 60749-9 : 2002 - Identical
DIN EN 60749-9 : 2016 - Identical
UNE EN 60749-9 : 2003 - Identical
NF EN 60749-9 : 2002 - Identical
BS EN 60749-9 : 2017 - Identical
DIN EN 60749-9 : 2016 - Identical
