IEEE 1149.1:2001 (R2008)被替代
Test Access Port and Boundary-scan Architecture
出版：Institute of Electrical and Electronics Engineers
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基本信息
標準編號： IEEE 1149.1:2001 (R2008)
標準類別：Standard
出版單位：Institute of Electrical and Electronics Engineers
標準頁數：208
標準簡介
Gives a definition of test logic which can be included as an integrated circuit to provide standardized approaches to testing interconnections between integrated circuits when assembled onto a printed circuit, testing the integrated circuit itself, and observing or modifying circuit activity during the component's normal operation. Coverage includes test logic architecture, the instruction register, test data registers, the bypass register, and the device identification register.
標準備注
Supersedes IEEE 1149.1B (09/2001) Supersedes IEEE DRAFT 1149.1 (02/2005)
替代本標準的新標準
