BS EN 60749-10:2002現行
Semiconductor devices. Mechanical and climatic test methods. Mechanical shock
出版：British Standards Institution
專家解讀視頻
Specifies a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation.
? British Standards Institution 2013
Replaces notes:
Partially replaces BS EN 60749:1999.
Amendment notes:
AMD 14112 published 17 September 2002
AMD 14112 is a Corrigendum
DIN EN 60749-10 : 2003 - Identical
I.S. EN 60749-10:2002 - Identical
UNE EN 60749-10 : 2003 - Identical
DIN EN 60749-10 : 2003 - Identical
I.S. EN 60749-10:2002 - Identical
IEC 60749-10 : 1.0 - Identical
NBN EN 60749-10 : 2003 - Identical
EN 60749-10 : 2002 - Identical
NF EN 60749-10 : 2002 - Identical
DIN EN 60749-10 (2003-04) - Identical
NBN EN 60749-10:2003 - Identical
NF EN 60749-10:2002 - Identical
I.S. EN 60749-10:2002 - Identical
IEC 60749-10 Ed. 1.0 - Identical
SS EN 60749-10 Ed. 1 (2003) - Identical
UNE EN 60749-10:2003 - Identical
EN 60749-10:2002 - Identical
