IEC 60749-11 : 1.0現行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 11: RAPID CHANGE OF TEMPERATURE - TWO-FLUID-BATH METHOD
出版：International Electrotechnical Committee
專家解讀視頻
States the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification.
BS EN 60749-11 : 2002 - Identical
NBR IEC 60749-11 : 2011 - Identical
CEI EN 60749-11 : 2004 - Identical
DS EN 60749-11 : 2002 COR 2 2003 - Identical
DIN EN 60749-11 : 2003 - Identical
PN EN 60749-11 : 2004 - Identical
NEN EN IEC 60749-11 : 2002 - Identical
