ASTM F867M-94A被替代
Guide for Ionizing Radiation Effects (Total Dose) Testing of Semiconductor Devices [Metric]
出版：American Society for Testing and Materials
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基本信息
標準編號： ASTM F867M-94A
發布時間：1994/12/1 0:00:00
標準類別：Standard
出版單位：American Society for Testing and Materials
標準頁數：0
標準簡介
CONTAINED IN VOL 10.04 1999Covers the requirements and procedures for testing semiconductor discrete devices and integrated for effects from ionizing radiation with electrons or gamma rays. Gives an accelerated aging testing for estimating low dose rate ionizing radiation effects on MOS devices. Does not cover tests using short pulses of ionizing radiation in which the effects of photocurrents are measured.
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