NF EN 60749-32:2003現行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 32: Flammability Of Plastic-encapsulated Devices (externally Induced)
出版：Association Francaise de Normalisation
專家解讀視頻
Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to external heating.
Indice de classement: C96-022-32. (12/2003) Supersedes NF EN 60749. (06/2007)
EN 60749-32:2003 - Identical
UNE EN 60749-32:2004 - Identical
SS EN 60749-32 Ed. 1 (2003) - Identical
IEC 60749-32 Ed. 1.0 - Identical
I.S. EN 60749-32:2003 - Identical
NBN EN 60749-32:2004 - Identical
DIN EN 60749-32 (2003-12) - Identical
BS EN 60749-32:2003 - Identical
SN EN 60749-32:2003 - Identical
DIN EN 60749-32 (2011-01) - Identical
SS EN 60749-32:2003 - Identical
BS EN 60749-32:2003+A1:2010 - Identical
