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ASTM F1192-00(2006)被替代
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
出版：American Society for Testing and Materials
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標(biāo)準(zhǔn)編號(hào)： ASTM F1192-00(2006)
發(fā)布時(shí)間：2006/7/1 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：American Society for Testing and Materials
標(biāo)準(zhǔn)頁數(shù)：11
標(biāo)準(zhǔn)簡介
CONTAINED IN VOL. 10.04, 2006Gives the requirements and procedures for testing integrated circuits and other devices for the effects of single event phenomena (SEP) induced by irradiation with heavy ions having an atomic number Z => 2.
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