EIA 311:1981 (R1999)被替代
Measurement Of Transistor Noise Figure At Mf, Hf, And Vhf
出版：JEDEC Solid State Technology Association
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基本信息
標準編號： EIA 311:1981 (R1999)
發布時間：1981/11/1 0:00:00
標準類別：Standard
出版單位：JEDEC Solid State Technology Association
標準頁數：20
標準簡介
Describes a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. It also adds the necessary information to make "effective input noise measurements." This method is a revision of EIA-311 and incorporates material previously found in EIA-283.
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