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EIA JESD 311:1981 (R2009)現(xiàn)行
Measurement Of Transistor Noise Figure At Mf, Hf, And Vhf
出版：JEDEC Solid State Technology Association
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基本信息
標(biāo)準(zhǔn)編號： EIA JESD 311:1981 (R2009)
發(fā)布時(shí)間：2009/3/1 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：JEDEC Solid State Technology Association
標(biāo)準(zhǔn)頁數(shù)：26
標(biāo)準(zhǔn)簡介
Specifies a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. Also, adds the necessary information to make 'effective input noise temperature measurements'.
標(biāo)準(zhǔn)備注
Renamed from EIA 311. (07/2010)
本標(biāo)準(zhǔn)替代的舊標(biāo)準(zhǔn)
