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NEN NPR IEC/PAS 62396-2:2007被替代
Process Management For Avionics - Atmospheric Radiation Effects - Part 2: Guidelines For The Single Event Effects Testing For Avionics Systems
出版：Nederlands Normalisatie Instituut
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標(biāo)準(zhǔn)編號(hào)： NEN NPR IEC/PAS 62396-2:2007
發(fā)布時(shí)間：2007/11/1 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：Nederlands Normalisatie Instituut
標(biāo)準(zhǔn)頁(yè)數(shù)：23
標(biāo)準(zhǔn)簡(jiǎn)介
Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons.
替代本標(biāo)準(zhǔn)的新標(biāo)準(zhǔn)
等同采用的國(guó)際標(biāo)準(zhǔn)
IEC/PAS 62396-2 Ed. 1.0 - Identical
