IEC 60749-18 Ed. 1.0現(xiàn)行
Semiconductor devices - Mechanical and climatic test methods Part 18: Ionizing radiation (total dose)
出版：International Electrotechnical Committee
專家解讀視頻
Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.
OVE/ONORM EN 60749-18:2003 - Identical
NEN EN IEC 60749-18:2003 - Identical
CEI EN 60749-18 Ed. 1 (2004) - Identical
SN EN 60749-18:2003 - Identical
BS EN 60749-18:2003 - Identical
DIN EN 60749-18 (2003-09) - Identical
NF EN 60749-18:2003 - Identical
I.S. EN 60749-18:2003 - Identical
PN EN 60749-18:2005 - Identical
SS EN 60749-18 Ed. 1 (2003) - Identical
UNE EN 60749-18:2003 - Identical
EN 60749-18:2003 - Identical
