DS EN 60749-31:2004現(xiàn)行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 31: Flammability Of Plastic-Encapsulated Devices (Internally Induced)
出版：Danish Standards
專家解讀視頻
Pertains to semiconductor device (discrete devices and integrated circuits). The aim of this test is to determine whether the device ignites due to internal heating caused by excessive overloads.
2004 version includes corrigendum 1. (08/2010)
EN 60749-31:2003 - Identical
IEC 60749-31 : 1.0 - Identical
EN 60749-31 : 2003 - Identical
IEC 60749-31 : 1.0 - Identical
