IEC 60749-31 : 1.0現行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 31: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (INTERNALLY INDUCED)
出版：International Electrotechnical Committee
專家解讀視頻
基本信息
標準編號： IEC 60749-31 : 1.0
發布時間：2002/8/30 0:00:00
標準類別：Standard
出版單位：International Electrotechnical Committee
標準頁數：19
標準簡介
Applies to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.
