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EIA JESD 398:1972 (R2009)現(xiàn)行
Measurement Of Small Values Of Transistor Capacitance
出版：JEDEC Solid State Technology Association
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基本信息
標(biāo)準(zhǔn)編號(hào)： EIA JESD 398:1972 (R2009)
發(fā)布時(shí)間：2009/3/1 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：JEDEC Solid State Technology Association
標(biāo)準(zhǔn)頁數(shù)：18
標(biāo)準(zhǔn)簡(jiǎn)介
Contains a three-terminal procedure for capacitance measurement with precautions for shielding of extraneous effects due to terminal leads and metal enclosures.
標(biāo)準(zhǔn)備注
Renamed from EIA 398. (07/2010)
本標(biāo)準(zhǔn)替代的舊標(biāo)準(zhǔn)
