EIA 398:1972 (R1999)被替代
Measurement Of Small Values Of Transistor Capacitance
出版：Joint Electronics Device Engineering Council (JEDEC)
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基本信息
標準編號： EIA 398:1972 (R1999)
發布時間：1972/7/1 0:00:00
標準類別：Standard
出版單位：Joint Electronics Device Engineering Council (JEDEC)
標準頁數：0
標準簡介
Contains a three-terminal procedure for capacitance measurement with precautions for shielding of extraneous effects due to terminal leads and metal enclosures.
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