EIA JESD 340:1967 (R2009)現行
Standard For The Measurement Of Cre
出版：JEDEC Solid State Technology Association
專家解讀視頻
基本信息
標準編號： EIA JESD 340:1967 (R2009)
發(fā)布時間：2009/3/1 0:00:00
標準類別：Standard
出版單位：JEDEC Solid State Technology Association
標準頁數：18
標準簡介
Provides an easily measured parameter which is one of the main characteristics in determining the stability of a transistor intended for small-signal operation. The measurement allows for rapid testing. Its correlation to ac stability will help establish the interchangeability of a device.
標準備注
Renamed from EIA 340. (07/2010)
本標準替代的舊標準
