當(dāng)前位置:
首頁(yè) >
標(biāo)準(zhǔn)詳情頁(yè)

Amendment To Cecc 50 000 (issue 4) Generic Specification: Discrete Semiconductor Devices - Addition Of Subclause 4.3.5 "test Methods For Microwave Devices" (cecc (secretariat) 2760, 2761, 2762, 2763, 2764 And 2765)
出版:British Standards Institution

專家解讀視頻
基本信息
標(biāo)準(zhǔn)編號(hào): 91/26544 DC
發(fā)布時(shí)間:1991/6/30 0:00:00
標(biāo)準(zhǔn)類別:Draft
出版單位:British Standards Institution
標(biāo)準(zhǔn)頁(yè)數(shù):0
標(biāo)準(zhǔn)簡(jiǎn)介
Possible amendment to BS CECC 50000
標(biāo)準(zhǔn)備注
? British Standards Institution 2013
替代本標(biāo)準(zhǔn)的新標(biāo)準(zhǔn)