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BS CECC 50000:1987現(xiàn)行
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
出版：British Standards Institution
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基本信息
標(biāo)準(zhǔn)編號： BS CECC 50000:1987
發(fā)布時間：1987/10/30 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：British Standards Institution
標(biāo)準(zhǔn)頁數(shù)：96
標(biāo)準(zhǔn)簡介
Applies to diodes, transistors, rectifier diodes and thyristors. Specifies quality assessment and test and measurement conditions. Appendices on structural similarity, inspection requirements, tests and screening.
標(biāo)準(zhǔn)備注
? British Standards Institution 2013
Amendment notes:
AMD 6016 published 31 July 1990
AMD 6366 published 30 September 1991
AMD 7012 published 15 October 1992
等同采用的國際標(biāo)準(zhǔn)
CECC 50000:1986 - Identical
