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EIA JESD 22-C101:2008被替代
Field-induced Charged-device Model Test Method For Electrostatic Discharge Withstand Thresholds Of Microelectronic Components
出版：JEDEC Solid State Technology Association
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基本信息
標(biāo)準(zhǔn)編號(hào)： EIA JESD 22-C101:2008
發(fā)布時(shí)間：2008/10/1 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：JEDEC Solid State Technology Association
標(biāo)準(zhǔn)頁數(shù)：0
標(biāo)準(zhǔn)簡介
Describes a uniform method for establishing charged-device model electrostatic discharge withstand thresholds. The charged-device-model simulates charging/discharging events that occur in production equipment and processes.
標(biāo)準(zhǔn)備注
Supersedes EIA JESD 22 (07/2004)
替代本標(biāo)準(zhǔn)的新標(biāo)準(zhǔn)
