EIA JESD 22-C101:2004被替代
Field-induced Charged-device Model Test Method For Electrostatic Discharge Withstand Thresholds Of Microelectronic Components
出版：JEDEC Solid State Technology Association
專家解讀視頻
基本信息
標準編號： EIA JESD 22-C101:2004
發布時間：2004/12/1 0:00:00
標準類別：Standard
出版單位：JEDEC Solid State Technology Association
標準頁數：0
標準簡介
Describes a uniform method for establishing charged-device model electrostatic discharge withstand thresholds. The charged-device-model simulates charging/discharging events that occur in production equipment and processes.
標準備注
Supersedes EIA JESD 22 (07/2004)
本標準替代的舊標準
替代本標準的新標準
