IEC 60147-2 Ed. 1.0廢止
Essential Ratings And Characteristics Of Semiconductor Devices And General Principles Of Measuring Methods - General Principles Of Measuring Methods
出版：International Electrotechnical Committee
專家解讀視頻
基本信息
標準編號： IEC 60147-2 Ed. 1.0
標準類別：Standard
出版單位：International Electrotechnical Committee
標準頁數：55
標準簡介
SEE SUPPLEMENTS 147-2A TO MGives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in Publication 147-1. It is intended that it will be eventually extended to cover all these parameters. This publication deals with transistors only.
